5SHY35L4503 3BHB004693R0001 3BHB004692R0002 5SXE01-0127 thyristor module controller

Bi-Directional Control Thyristor (BCT) Testing Procedures

Overview:

• Testing of BCT follows a similar sequence and philosophy as the well-proven Phase Control Thyristor (PCT).
• Extensive qualification and adherence to standards ensure high quality and reliability.
• Routine production testing and qualification test procedures are detailed.

General Production Testing

Group A Testing: 100% Routine Production Testing

• Basic electrical parameter testing at wafer level and after packaging.
• BCT has two thyristor-halves (A and B), requiring measurements for various parameters for both halves.
• Parameters include forward repetitive voltage, surge voltage, critical dv/dt, recovery charge, gate trigger voltage, and others.
• Parameters measured at different temperatures (e.g., 25°C, 125°C).
• Parameters QA, QB, VRMA, VRMB, VSMA, VSMB, dv/dt critA, dv/dt critB, VTA, VTB, IGTA, VGTA, IGTB, VGTB, tqA, tqB, ITSMA, ITSMB are tested and reported.
• Other parameters may be agreed upon based on customer requirements.
• Test reports include computer print-outs of the final test.

Group B Testing: Lot Control Tests (Scheduled Product Audits)

• Integrated for final screening to assure and monitor long-term voltage stability.
• Eight devices per selected lot undergo a 24-hour voltage stability test at VDC A,B = 2/3 VRM (DC forward voltage at thyristor-half A, maximum forward repetitive voltage).
• Typical pass criterion is that the drift of the leakage current be ≤ 0.2 mA.

Related Documents and Standards:

• Refers to sections 4.6 and 4.7 of the 1996 edition of the PCT data book of ABB Semiconductors for information on related documents, standards, product traceability, and failure analysis.
• These sections are also applicable to BCT.

Note:

• The details provided here offer insight into the specific parameters tested during routine production for BCTs, ensuring their reliability and quality.