Description
Manufacturer | ABB |
Brand | ABB |
Series | module |
Part Number | CI547 |
Product Type | module |
Quality | 100% New Original |
Stock | In stock |
Delivery time | 1-3 days after Payment |
After-sales Service | Have |
Warranty | 1 year |
Shipping term | DHL / FEDEX/ EMS /UPS/TNT/EMS |
Packaging details: if you need an urgent delivery order, please feel free to contact us, and we will do our best to meet your needs.
Price problem: if you find that other suppliers offer cheaper prices for the same product, we are also willing to provide you with reference prices and give you further discounts.
The Input Module automatically performs local measurements of several
onboard signals that can be used for detailed fault finding and verification of
Module operating characteristics. Measurements are made within each slice’s
HIU and FIU.
From the IMB to the field connector, the Input Module contains extensive
fault detection and integrity testing. As an input device, all testing is
performed in a non-interfering mode. Data input from the IMB is stored in
redundant error-correcting RAM on each slice portion of the HIU. Received
data is voted on by each slice. All data transmissions include a confirmation
response from the receiver.
Between the HIU and FIU, there are a series of optically isolated links for data
and power. The data link is synchronized and monitored for variance. Both
the FIU and HIU have onboard temperature sensors to characterize
temperature-related problems.
The power supplies for both the HIU and FIU boards are redundant, fully
instrumented and testable. Together, these assemblies form a Power Integrity
Subsystem.
The module field input is connected to a single bit ADC known as the ΣΔ input
circuit. These circuits, one per channel on each slice, produce a digital output
that naturally transitions between on and off. Any failure in the circuit causes
the output to saturate to stuck-on or stuck-off, which is automatically
detected. As the conversion process is dynamic and not gated like traditional
ADCs, failures are rapidly diagnosed and located.
By using the Σ∆ circuit, the analog path in the Module is short and does not
involve many components. This results in analog failures being contained to a
single channel on a single slice instead of causing a group of eight or more
inputs to fail.